JOINT
MEETING EUROPEAN FREQUENCY AND TIME FORUM - IEEE - IFCS -
13-16 APRIL 1999 -
BESANCON - FRANCE
HIGH STABILITY, MINIATURE
OCXOs
FOR SEVERE ENVIRONMENTAL
CONDITIONS
HIGH TEMPERATURE EFFECTS
ON AGING AND RETRACE CHARACTERISTICS
E. GIRARDET
A.R.ELECTRONIQUE F-25048 BESANÇON
B. WOLCOFF
A.R.ELECTRONIQUE F-78500 SARTROUVILLE
1- ABSTRACT
A.R.Electronique has developed
a new generation of high stability compact OCXOs, especially
designed for tactical, on board avionic / missile application
or geophysical use.
These oscillators are built
with SC cut, low g sensitivity resonators, associated with a fully
integrated electronic (monolithic ASIC).
The extremely severe environmental
requirements induces a hard mounted resonators structure,
fully compatible with high stability. The extended temperature
range (up to +115°C) involves a temperature regulation on
the 2nd turn over point of the SC cut thermal curve, at about
+120°C.
After giving the environmental
conditions and associated electrical requirements, the paper describes
summarily the crystal resonator, oscillator and assembly designs.
Practical experimental
results are showed, including :
- resonators g sensitivity measurements,
- phase noise under high level random vibrations
(50g / 2000 Hz),
- frequency stability versus wide temperature
range (-40, +120)°C,
- fast warm-up (frequency, power),
- internal temperature gradient effect.
The aging and retrace behavior
is especially pointed out : the effect of very high ovenized temperature
is presentated, based on comparative long term stability measurements
done on first and second turn-over point (characterizations on
18 months).
Some other parallel oscillators
developments, based on the use of the same type of high reliability
resonators will be quickly describe.
2- FUNCTIONNAL REQUIREMENTS
A large range of avionic
or missile electronic systems, such as GPS receivers, radars,
electronic war, missile guiding, requires the use of high stability
oscillators.
Their main electrical characteristics
(frequency stability, warm-up, retrace, phase noise, spectral
purity) must be obtained under severe environmental conditions
(temperature, vibrations, shock), with a high reliability level.
The last generation of
airborne systems have been developed with new targets :
- cost reduction,
- size miniaturization,
- modular system architecture,
- standardization.
These objectives have direct
consequences on the oscillators characteristics :
- The use of the same oscillator for different
system applications extends its electrical requirements.
- The new systems are designed on standard
PC boards, mounted on sliding aluminium structure. This involves
a size miniaturization (especially the height), and eliminates
the possibility to use shock and vibration absorbers as well as
thermal ventilation. In addition, the PC board mechanical structure
is not inert : the vibration levels applied on the system are
widely amplified on the base of the oscillator (see below).
The main expected oscillators
requirements can be summarize as follows :
Electrical characteristics
:
- nominal frequency : 10 MHz
- Fcy vs temp. stability : +/- 1.10-7
to +/- 2.10-8
- aging per year : +/- 1.10-7 to +/- 2.10-8
- retrace : < +/- 1.10-8
- warm-up time (-40°C) : +/-1.10-7
< 150s
- phase noise degration : g sensitivity
<5.10-10/g
- size : 27 x 36 x 11 mm (w x L x h)
Environmental characteristics
:
- temperature range : -45 to + 115°C
- vibration :
on system : 10 grms, 10 to 2 KHz,
one axis
on OCXO : up to 50 grms (+ transverse)
- shock : 15g - 11 ms
- MIL HDBK 217E/F 100 000
hours
3- OSCILLATORS
DESIGN
-
Crystal resonator
In order to optimize the main requirements
in tactical use, such as g sensitivity, retrace, aging, static
and dynamic thermal behavior, SC cut crystals have been obviously
chosen. 20 MHz and 10 MHz, 3rd overtone resonators have been tested.
They are mounted in a low profile, 4 points T08 enclosure.
The mounting structure is optimized for
mechanical behavior under vibration and g sensitivity. The first
internal mechanical resonances are above 5 KHz (3 axes), far away
from the maximal environmental vibration frequencies. Fig [1]
shows the experimental results of g sensitivity measurements.
The average values are typically 2 / 3.10-10 / g, relatively independent
form the excitation axis, as well as from the nominal frequency
(10 / 20 MHz)
Figure [1] : g sensitivity,
experimental measurements
SC cut, 3rd O.T.
T08, 4 points enclosure
|
Fcy
|
10
MHz
|
20
MHz
|
Batch qty
|
20
|
26
|
s/g (10-10)
|
Min.
|
Av.
|
Max.
|
Min.
|
Av.
|
Max.
|
Z
|
1,0
|
2,0
|
2,7
|
1,5
|
3,1
|
3,6
|
X
|
1,1
|
2,6
|
3,2
|
1,3
|
2,2
|
3,3
|
Y
|
1,5
|
3,2
|
3,9
|
1,7
|
3,5
|
4,1
|
Z axis : perpendicular
to the blank
|
X, Y axes : parallel
to the blank
|
- Electronic functions
A.R.Electronique has designed
a specific, high reliability ASIC circuit, which includes the
oscillator, the amplifier, as well as the voltage regulator and
the oven control (LCC16 enclosure). The external adjustment components
are SMD devices (see fig [2]).
Figure [2] : high stability
compact OCXO

- Mechanical and
thermal design
Classical OCXOs disadvantages
consist of long warm-up time and power consumption. In order to
improve these parameters, only the crystal resonator is warmed.
The heating temperature
is set to the second turn-over point of the temperature curve
(3 to 5°C upper than the maximum temperature limit) (see
fig [3]).
: SC cut crystal ovenized
on 2nd T.O.P.

The crystal enclosure fixation
on the PC board is designed in order to optimize at the same time
the mechanical fastening and the thermal insulation : this aspect
is critical for fast warm-up because of the extended temperature
range (typical [40, + 115]°C). The temperature sensitivity
of the oscillator can not be consider as negligible : an electronic
compensation is used in order to minimize it.
The PC board is finally
enclosed inside an hermetic metal package (economic standard size
with specific mounting pins) (see fig [4]).
Figure [4] : 2736 HM 12
enclosure (mm)

The different mounting
and assembly techniques have been tested for reliability.
4-EXPERIMENTAL RESULTS
4-1 Phase noise under
vibration
As explained above, the
environmental vibration on the oscillator is often degraded by
the use of standard, non optimized mechanical structure. Fig [5]
shows a practical example.
Figure [5] :- example of
practical mechanical environment
Vibration |
Theoretical
/ effective levels (g.r.m.s.)
|
Axis |
x
|
y
|
z
|
X |
10
/ 45
|
0 / 16
|
0 / 22
|
Y |
0 / 11
|
10
/ 24
|
0 / 13
|
Z |
0 / 19
|
0 / 9
|
10
/ 55
|
P.C.B. mechanical spurious
frequencies :
540 Hz / 700 Hz / 1 160
Hz / 1 350 Hz
A random vibration spectrum
of 10g rms (10 to 2000 Hz) is applied on the device under test
(one axis). On the base of the oscillators support, this
level is multiplied with a factor of 2 to 5 in the same axis.
In addition, transverse excitations appear in the perpendicular
directions. These phenomenas are directly due to the mechanical
resonances of the PCB support (between 500 to 1500 Hz).
Fig [6] give the phase
noise behavior of the oscillator mounted as described. Under 500
Hz, the phase noise value is directly connected with the modulation
due to the resonators g sensitivity (about 2.10-10/g) :

Figure [6] : phase noise
under vibration : exemple

Above 500 Hz, the support
mechanical resonances (3 axes) induce large bandwidth spurious.
Some characterizations have been done on the oscillator only :
for frequencies lower than 2 KHz, the internal structure does
not show any significative mechanical resonances.
4-2 Frequency stability
versus temperature range
The quality factor of the
crystals thermal regulation is about 150 : for an external
temperature range of 40 to +115°C, the regulated temperature
on the crystal varies of about +/- 0,5°C. This induces a relatively
low frequency drift about some 10-9. The major effect concerns
the oscillators temperature sensitivity, which is highly
connected to the crystal motional parameters, depending on the
frequency. By using an adapted electronic compensation, it is
possible to guarantee frequency stabilities as below :
10 MHz (SC cut, 3rd O.T.
crystal) : +/-2.10-8
20 MHz (SC cut, 3rd O.T.
crystal) : +/-1.10-7
Fig [7] shows an example
of frequency vs temperature curve (-40, +115)°C.
Figure [7] : 10MHz compact
OCXO Fcy vs Temp. Curve

The thermal behavior is
characterized in the full temperature range, by applying a slope
of 0,5 to +1,5°C / min (positive and negative senses). If
better stability is required, it is no more possible to use the
same thermal structure : the sensitive electronic circuitry must
be ovenized. In this case, power consumption, warm-up time, will
be degraded.
Another interesting characterization
tool is called I.T.G.E. (Internal Thermal Gradient Effect) : this
parameter evaluates the frequency variation versus the oscillators
orientation, at a stabilized temperature : this is a functional
requirement for an airborne application. The g sensitivity effect
(a few 10-10/g) can be consider as negligible for this type of
OCXO.
The I.T.G.E. order of value
must be lower than the direct temperature effect :
10 MHz (SC, 3rd O.T.)
: I.T.G.E. < +/-5.10-9
20 MHz (SC, 3rd O.T.)
: I.T.G.E. < +/-2.10-8
(see Fig [8])
Figure [8] : 10 MHz compact
OCXO I.T.G.E.

4-3 Warm-up
As the oscillator is used
on the same system for different applications, the warm-up requirements
take two levels :
- Frequency start-up at turn on (typically
100/300ms)
- Time value for obtaining the frequency
stability level (+/-1.10-7 / +/-2.10-8)
Because of the use of SC
cut resonators, the start-up frequency offset can reach 150
to 200 ppm at lower temperature.
The warm-up speed (point
[2]) can be reduced by increasing the power consumption during
start-up. However, this parameter must be optimized by considering
the thermal structure of the oscillator.
Figure [9] : 10 MHz compact
OCXO
Warm-up at 40°C

The lower temperature range
is of course the most critical case. Fig [9] shows a typical warm-up
characteristic (frequency, power consumption) of a 10 MHz miniaturized
OCXO, at 40°C (power limit=5W) :
- Nominal frequency :+/- 1.10-7 : <
135 s
- Nominal frequency :+/- 1.10-8: < 240
s
4-4 Aging
Retrace
The characterization of
these operational parameters must take into account the specificities
of airborne working profile : alternate working on short periods
(3- 6 hours), with long storage periods (1 day to 1 week).
A.R.Electronique has launched
a large measurement campaign on 18 months in order to characterize
the behavior of these families of high stability miniature OCXO
(10 and 20 MHz crystals).
The increased oven temperature
as well as the working storage profile effects were analysed on
significative periods, as shown below :
Phase |
Oventemperature |
Workingprofile |
Cumulated Working hours |
|
|
|
80-85°C |
115-120°C |
1 |
80– 85°C
|
Continuous |
2 500 |
|
2 |
115–120°C |
Continuous |
2 500 |
500 |
3 |
115-120°C |
Alternate(2x3hrs/day) |
2 500 |
680 |
4 |
115-120°C |
Continuous |
2 500 |
2 840 |
5 |
115-120°C |
Retrace measurements (3 months) |
6 |
115-120°C |
Continuous |
2 500 |
7 500 |
|
|
|
|
|
|
Measurement results :
- Aging : the oscillators
are measured two times per day at ambient temperature. The aging
slope per month is computed on the last 10 days of each phase.
Phase |
10
MHz OCXO
|
20
MHz OCXO
|
|
Average
|
Max.
|
Average
|
Max.
|
1 (3,5m) |
+ 4,5.10-9 |
+ 8.10-9 |
+ 2,5.10-8 |
+ 4.10-8 |
2 (1m)
|
+ 5.10-8 |
+ 7.10-8 |
+ 1,3.10-7 |
+ 1,7.10-7 |
3 (1m)
|
+ 1,3.10-8 |
+ 1,7.10-8 |
+ 3.10-8 |
+ 4,2.10-8 |
4 (1m)
|
+ 2,9.10-8 |
+ 4,5.10-8 |
+ 8,1.10-8 |
+ 1,3.10-7 |
4 (3m)
|
+ 1,1.10-8 |
+ 1,9.10-8 |
+ 3,5.10-8 |
+ 6.10-8 |
6 (5m)
|
+ 6.10-9 |
+ 1,2.10-8 |
+ 1,5.10-8 |
+ 2,6.10-8 |
As an example, Fig [10]
shows the aging behavior of a 10 MHz OCXO, ovenized at +115°C.
On this curve, the continuous / alternate working effect appears
clearly.
Figure 10 : aging measurement
10 MHz OCXO ovenized at
115°C

- Retrace : 14 retrace
measurements have been done during 3 months (phase 5). Each cycle
consists of one week inert storage (alternatively at temperatures
10°C, +115°C). The OCXOs are powered during 3 hours
(frequency measurements 3 hours after turn-on). The relative value
gives the frequency offset between two successive start-up. The
cumulated value gives the absolute frequency offset after the
whole retrace measurements period (3 months).
|
10
MHz
|
20
MHz
|
|
Average
|
Max.
|
Average
|
Max.
|
Relative |
8.10-9
|
2.10-8
|
1,5.10-8
|
2,7.10-8
|
Cumulated |
1,6.10-8
|
3,3.10-8
|
2,2.10-8
|
6.10-8
|
Results analysis
As expected, the high temperature
oven control effect is clearly identified : after increasing the
oven temperature (phases 1, 2), the aging is immediately degraded
with a factor of 5 to 10.
However, this factor decreases
significatively with the time : after about 1 year, the monthly
aging at 115°C oven temperature reaches the same order of
value than the initial aging at 85°C.
The alternate working test
(phases 2, 3, 4) shows that, as a first approximation, for high
temperature oven control OCXOs, the aging is quite proportional
to the effective working time.
The retrace measurements
must be analysed regarding the test profile (hard temperature
cycling between measurements). The level of results are compatible
with the expected values.
All these tests have also
confirmed the significative superiority of 10 MHz crystals compared
with 20 MHz crystals.
5- CONCLUSION
More than 18 months of
experimental measurements under severe environmental conditions
have confirmed the high level of performance and reliability of
these new miniature high stability oscillators.
Primarly designed for avionic,
military requirements, the same families of crystal resonators
have been introduced for other application fields.
As preliminary approach,
they have been tested also under specific space requirements (vacuum).
For example :
- high stability 10 MHz
sources for avionic application : the PULSAR-EM family offers
temperature stability range of 1.10-9 (electronic + crystal ovenized),
in a aluminium airborne case.
- compact OCXO type MICROSTAR
for geophysical application (mud logging) : the specificities
concern the very high working temperature and shock conditions.
REFERENCES
Valdois M., Besson J.,
and Gagnepain J.J.
Influence of environment
conditions on a quartz resonator : proc. 28th F.C.S. (1974)
Filler R.L. and Vig J.R.
The acceleration sensitivity of quartz crystal
oscillators : a review. proc. 41st F.C.S. (1987)
|